2026 IEEE European Test Symposium (ETS)

dAIEDGE will participate in the IEEE European Test Symposium (ETS 2026), Europe's leading forum on testing, reliability, safety, security and validation of electronic circuits and systems. The symposium will bring together researchers and industry experts to exchange knowledge on the latest advances in dependable computing, electronic system design and AI-enabled technologies.

As part of the conference, Synopsys and SU-CNRS will present the article "Towards Resilient Transformer-Encoders: Fault Injection and Hardware Agnostic Error Mitigation". The paper will present novel approaches to improving the resilience of transformer encoder models by combining fault injection techniques with hardware-agnostic error mitigation strategies. This contribution will reinforce dAIEDGE's commitment to developing trustworthy and reliable AI systems for edge computing, while providing an opportunity to disseminate the project's latest research results and strengthen collaboration with both the academic and industrial communities.

calendar Stat date 25/05/2026
calendar End date 29/05/2026
location Location

Ghania, Greece

graduation Modality On-site
Congresses Present