dAIEDGE will participate in the IEEE European Test Symposium (ETS 2025), Europe's leading forum on testing, reliability, safety, security and validation of electronic circuits and systems. The symposium will bring together researchers and industry experts to discuss the latest scientific advances and practical applications in electronic system design, testing and dependable computing.
As part of the conference, Synopsys and SU-CNRS will present the paper "On the Fault Sensitivity of Natural Language Embeddings Computation". This contribution will highlight dAIEDGE's research on the reliability and robustness of AI systems, addressing key challenges in ensuring dependable AI computation for next-generation edge applications. Through its participation, dAIEDGE will disseminate its latest research results, engage with both academic and industrial stakeholders, and strengthen collaborations in the fields of trustworthy AI, hardware reliability and Edge AI technologies.
Stat date
26/05/2025
End date
30/05/2025
Location
Tallin, Estonia
Modality
On-site