dAIEDGE will participate in the Design, Automation and Test in Europe (DATE) Conference 2025, Europe's leading event for electronic design automation, hardware and software design, embedded systems, testing and manufacturing of electronic circuits and systems. The conference will bring together researchers, technology providers and industry representatives to discuss the latest scientific advances and emerging trends in electronic system design and validation.
As part of the conference, SU-CNRS will present the paper "Minimum Time Maximum Fault Coverage Testing of Spiking Neural Networks". This contribution will introduce novel techniques for efficiently testing spiking neural networks, improving fault coverage while reducing testing time to enhance the reliability of neuromorphic AI systems. Through its participation, dAIEDGE will disseminate its latest research on dependable AI and Edge AI technologies, strengthen collaboration with the international research and industrial communities, and contribute to the development of trustworthy next-generation computing systems.
Stat date
31/03/2025
End date
02/04/2025
Location
Lyon Convention Centre, Lyon (France)
Modality
On-site